TAP1500 Single-ended Active FET Probe provides excellent high-speed electrical and mechanical performance required for today's digital system designs.  
    Key features  
    -   Outstanding electrical performance    -   ≥1.5 GHz probe bandwidth  
-   <267 ps rise time  
-   ≤1 pF input capacitance  
-   1 M? input resistance  
-   -8 V to +8 V input dynamic range  
-   -10 V to +10 VDC input offset range  
 
-   Versatile mechanical performance    -   Small compact probe head for probing small geometry circuit elements  
-   DUT attachment accessories enable connection to SMDs as small as 0.5 mm pitch  
-   Robust design for reliability  
 
-   Easy to use    -   Connects directly to oscilloscopes with the TekVPI™ probe interface  
-   Provides automatic units scaling and readout on the oscilloscope display  
-   Easy access to oscilloscope probe menu display for probe status/diagnostic information, and to control probe DC offset  
-   Remote GPIB/USB probe control through the oscilloscope  
 
-   Applications    -   High-speed Digital Systems Design  
-   Component Design and Characterization  
-   Manufacturing Engineering and Test  
-   Educational Research  
-   Signals with Voltage Swings up to 16 V  
 
  1.5 GHz active probes for TekVPI™ probe interface  
  Specifically designed for use and direct connection to oscilloscopes with the TekVPI™ probe interface, the TAP1500 Active FET probe achieves high-speed signal acquisition and measurement fidelity by solving three traditional problems:    -   Lower DUT loading effects with ≤1 pF input capacitance and 1 M? input resistance  
-   Versatile DUT connectivity for attaching to small SMDs  
-   Preserves instrument bandwidth at the probe tip for ≤1 GHz oscilloscopes